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Effective IR-drop reduction in at-speed scan testing using Distribution-Controlling X-Identification.

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Title:

Effective IR-drop reduction in at-speed scan testing using Distribution-Controlling X-Identification.

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2008

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Conference paper

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Name:	2008 International Conference on Computer-Aided Design (ICCAD'08), November 10-13, 2008, San Jose, CA, USA 2008
DBLP:	db/conf/iccad/iccad2008.html