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A gate delay model focusing on current fluctuation over wide-range of process and environmental variability.

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A gate delay model focusing on current fluctuation over wide-range of process and environmental variability.

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2006

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Conference paper

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Name:	2006 International Conference on Computer-Aided Design (ICCAD'06), November 5-9, 2006, San Jose, CA, USA 2006
DBLP:	db/conf/iccad/iccad2006.html