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Dynamic test scheduling for analog circuits for improved test quality.

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    Publication properties
    Title: Dynamic test scheduling for analog circuits for improved test quality.
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    Date: 2008
    Publication type: Conference paper
    Authors:
    No. First name Last name Show
    1. Ender Yilmaz
    2. Sule Ozev
    Download (by DOI): 10.1109/ICCD.2008.4751866
    BibTeX: conf/iccd/YilmazO08
    DBLP: db/conf/iccd/iccd2008.html#YilmazO08
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    Conference
    Name: 26th International Conference on Computer Design, ICCD 2008, 12-15 October 2008, Lake Tahoe, CA, USA, Proceedings 2008
    DBLP: db/conf/iccd/iccd2008.html