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Learning from artifacts: metadata utilization analysis.

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    Title: Learning from artifacts: metadata utilization analysis.
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    Date: 2006
    Publication type: Conference paper
    Authors:
    No. First name Last name Show
    1. William E. Moen
    2. Shawne D. Miksa
    3. Amy Eklund
    4. Serhiy Polyakov
    5. Gregory Snyder
    Download (by DOI): 10.1145/1141753.1141813
    BibTeX: conf/jcdl/MoenMEPS06
    DBLP: db/conf/jcdl/jcdl2006.html#MoenMEPS06
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    Conference
    Name: ACM/IEEE Joint Conference on Digital Libraries, JCDL 2006, Chapel Hill, NC, USA, June 11-15, 2006, Proceedings 2006
    DBLP: db/conf/jcdl/jcdl2006.html