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Title:	TIGUAN: Thread-Parallel Integrated Test Pattern Generator Utilizing Satisfiability ANalysis.
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Date:	2009
Publication type:	Conference paper
Authors:	No. First name Last name Show 1. Alejandro Czutro 2. Ilia Polian 3. Matthew D. T. Lewis 4. Piet Engelke 5. Sudhakar M. Reddy 6. Bernd Becker
Download (by DOI):	10.1109/VLSI.Design.2009.20
BibTeX:	conf/vlsid/CzutroPLERB09
DBLP:	db/conf/vlsid/vlsid2009.html#CzutroPLERB09
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Conference
Name:	VLSI Design 2009: Improving Productivity through Higher Abstraction, The 22nd International Conference on VLSI Design, New Delhi, India, 5-9 January 2009 2009
DBLP:	db/conf/vlsid/vlsid2009.html