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An asynchronous algorithm for sequential circuit test generation on a network of workstations.

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An asynchronous algorithm for sequential circuit test generation on a network of workstations.

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1995

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Conference paper

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Name:	8th International Conference on VLSI Design (VLSI Design 1995), 4-7 January 1995, New Delhi, India 1995
DBLP:	db/conf/vlsid/vlsid1995.html