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Current Measurement for Dynamic Idd Test.

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Current Measurement for Dynamic Idd Test.

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2001

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Name:	19th IEEE VLSI Test Symposium (VTS 2001), Test and Diagnosis in a Nanometric World, 29 April - 3 May 2001, Marina Del Rey, CA, USA 2001
DBLP:	db/conf/vts/vts2001.html