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First name:	Diana
Last name:	Vega
DBLP:	03/5183
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Show	Title	Venue	Rating	Date
	George Din, Diana Vega, Ina Schieferdecker. Automated Maintainability of TTCN-3 Test Suites Based on Guideline Checking.	Software Technologies for Embedded and Ubiquitous Systems, 6th IFIP WG 10.2 International Workshop, SEUS 2008, Anacarpi, Capri Island, Italy, October 1-3, 2008, Proceedings 2008	(0)	2008
	Diana Vega, George Din, Stefan Taranu, Ina Schieferdecker. Application of Clustering Methods for Analysing of TTCN-3 Test Data Quality.	Proceedings of the Third International Conference on Software Engineering Advances, ICSEA 2008, October 26-31, 2008, Sliema, Malta 2008	(0)	2008
	Diana Vega, Ina Schieferdecker, George Din. Test Data Variance as a Test Quality Measure: Exemplified for TTCN-3.	Testing of Software and Communicating Systems, 19th IFIP TC6/WG6.1 International Conference, TestCom 2007, 7th International Workshop, FATES 2007, Tallinn, Estonia, June 26-29, 2007, Proceedings 2007	(0)	2007
	Benjamin Zeiss, Diana Vega, Ina Schieferdecker, Helmut Neukirchen, Jens Grabowski. Applying the ISO 9126 quality model to test specifications - exemplified for TTCN-3 test specifications.	Software Engineering 2007, Fachtagung des GI-Fachbereichs Softwaretechnik, 27.-30.3.2007 in Hamburg 2007	(0)	2007

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