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First name:	Carol
Last name:	Pyron
DBLP:	12/4622
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Show	Title	Venue	Rating	Date
	Magdy S. Abadir, Jing Zeng, Carol Pyron, Juhong Zhu. Automated Test Model Generation from Switch Level Custom Circuits.	12th Asian Test Symposium (ATS 2003), 17-19 November 2003, Xian, China 2003	(0)	2003
	John Gatej, Lee Song, Carol Pyron, Rajesh Raina, Tom Munns. valuating ATE Features in Terms of Test Escape Rates and Other Cost of Test Culprits.	Proceedings IEEE International Test Conference 2002, Baltimore, MD, USA, October 7-10, 2002 2002	(0)	2002
	Carol Pyron. Scan and BIST Can Almost Achieve Test Quality Levels.	Proceedings IEEE International Test Conference 2002, Baltimore, MD, USA, October 7-10, 2002 2002	(0)	2002
	Carol Pyron, Rekha Bangalore, Dawit Belete, Jason Goertz, Ashutosh Razdan, Denise Younger. Silicon Symptoms to Solutions: Applying Design for Debug Techniques.	Proceedings IEEE International Test Conference 2002, Baltimore, MD, USA, October 7-10, 2002 2002	(0)	2002
	Nandu Tendolkar, Robert F. Molyneaux, Carol Pyron, Rajesh Raina. At-Speed Testing of Delay Faults for Motorola's MPC7400, a PowerPC(tm) Microprocessor.	18th IEEE VLSI Test Symposium (VTS 2000), 30 April - 4 May 2000, Montreal, Canada 2000	(0)	2000
	Carol Pyron, Mike Alexander, James Golab, George Joos, Bruce Long, Robert F. Molyneaux, Rajesh Raina, Nandu Tendolkar. DFT advances in the Motorola's MPC7400, a PowerPC G4 microprocessor.	Proceedings IEEE International Test Conference 1999, Atlantic City, NJ, USA, 27-30 September 1999 1999	(0)	1999
	Carol Pyron, Javier Prado, James Golab. Test Strategy for the PowerPC 750 Microprocessor.	IEEE Design Test of Computers 1998, Volume 15	(0)	1998
	Carol Pyron, Javier Prado, James Golab. Next-Generation PowerPC	Proceedings IEEE International Test Conference 1997, Washington, DC, USA, November 3-5, 1997 1997	(0)	1997
	Carol Pyron, W. C. Bruce. Implementing 1149.1 in the PowerPC	Proceedings IEEE International Test Conference 1995, Driving Down the Cost of Test, Washington, DC, USA, October 21-25, 1995 1995	(0)	1995
	Michael G. Wahl, Carol Pyron. EDIF Test - The Upcoming Standard for Test Data Transfers.	Proceedings IEEE International Test Conference 1992, Discover the New World of Test and Design, Baltimore, Maryland, USA, September 20-24, 1992 1992	(0)	1992

Your query returned 12 matches in the database.