Publications :: Search

Show author

On this page you see the details of the selected author.

Author information
First name:	Jenny
Last name:	Leung
DBLP:	17/6136
Rating:	(not rated yet)
Bookmark:

Below you find the publications which have been written by this author.

Show item 1 to 4 of 4  

Select a publication
Show	Title	Venue	Rating	Date
	Jenny Leung, Glenn H. Chapman, Israel Koren, Zahava Koren. Characterization of Gain Enhanced In-Field Defects in Digital Imagers.	24th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, DFT 2009, 7-9 October 2009, Chicago, Illinois, USA 2009	(0)	2009
	Jenny Leung, Glenn H. Chapman, Israel Koren, Zahava Koren. Automatic Detection of In-field eld Defect Growth in Image Sensors.	23rd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2008), 1-3 October 2008, Boston, MA, USA 2008	(0)	2008
	Jozsef Dudas, Michelle L. La Haye, Jenny Leung, Glenn H. Chapman. A Fault-Tolerant Active Pixel Sensor to Correct In-Field Hot Pixel Defects.	22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2007), 26-28 September 2007, Rome, Italy. 2007	(0)	2007
	Jenny Leung, Jozsef Dudas, Glenn H. Chapman, Israel Koren, Zahava Koren. Quantitative Analysis of In-Field Defects in Image Sensor Arrays.	22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2007), 26-28 September 2007, Rome, Italy. 2007	(0)	2007

Your query returned 4 matches in the database.