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First name:	Haruhiko
Last name:	Abe
DBLP:	34/5066
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	Narumi Sakashita, Fumihiro Okuda, Ken'ichi Shimomura, Hiroki Shimano, Mitsuhiro Hamada, Tetsuo Tada, Shinji Komori, Kazuo Kyuma, Akihiko Yasuoka, Haruhiko Abe. A Built-In Self-Test Circuit with Timing Margin Test Function in a 1Gbit Synchronous DRAM.	Proceedings IEEE International Test Conference 1996, Test and Design Validity, Washington, DC, USA, October 20-25, 1996 1996	(0)	1996

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