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First name:	Arkan
Last name:	Abdulrahman
DBLP:	73/2737
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Show	Title	Venue	Rating	Date
	Edward Flanigan, Arkan Abdulrahman, Spyros Tragoudas. Sequential Path Delay Fault Identification Using Encoded Delay Propagation Signatures.	9th International Symposium on Quality of Electronic Design (ISQED 2008), 17-19 March 2008, San Jose, CA, USA 2008	(0)	2008
	Arkan Abdulrahman, Spyros Tragoudas. Low-power multi-core ATPG to target concurrency.	Integration 2008, Volume 41	(0)	2008
	Arkan Abdulrahman, Spyros Tragoudas. Power-Aware Test Pattern Generation for Improved Concurrency at the Core Level.	7th International Symposium on Quality of Electronic Design (ISQED 2006), 27-29 March 2006, San Jose, CA, USA 2006	(0)	2006
	Arkan Abdulrahman, Spyros Tragoudas. Compact ATPG for Concurrent SOC Testing.	Fifth International Workshop on Microprocessor Test and Verification (MTV 2004), Common Challenges and Solutions, 08-10 September 2004, Austin, Texas, USA 2004	(0)	2004

Your query returned 4 matches in the database.