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First name:	William H.
Last name:	McAnney
DBLP:	94/4668
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Show	Title	Venue	Rating	Date
	Jacob Savir, William H. McAnney. A Multiple Seed Linear Feedback Shift Register.	IEEE Trans. Computers 1992, Volume 41	(0)	1992
	Jacob Savir, William H. McAnney, Salvatore R. Vecchio. Testing for Coupled Cells in Random-Access Memories.	IEEE Trans. Computers 1991, Volume 40	(0)	1991
	Jacob Savir, William H. McAnney, Salvatore R. Vecchio. Testing for Coupled Cells in Random-Access Memories.	Proceedings International Test Conference 1989, Washington, D.C., USA, August 1989 1989	(0)	1989
	Jacob Savir, William H. McAnney. Identification of Failing Tests with Cycling Registers.	Proceedings International Test Conference 1988, Washington, D.C., USA, September 1988 1988	(0)	1988
	William H. McAnney, Jacob Savir. Built-In Checking of the Correct Self-Test Signature.	IEEE Trans. Computers 1988, Volume 37	(0)	1988
	Jacob Savir, William H. McAnney. Random Pattern Testability of Delay Faults.	IEEE Trans. Computers 1988, Volume 37	(0)	1988
	Jacob Savir, William H. McAnney, Salvatore R. Vecchio. Fault Propagation Through Embedded Multiport Memories.	IEEE Trans. Computers 1987, Volume 36	(0)	1987
	William H. McAnney, Jacob Savir. Built-In Checking of the Correct Self-Test Signature.	Proceedings International Test Conference 1986, Washington, D.C., USA, September 1986 1986	(0)	1986
	Jacob Savir, William H. McAnney. Random Pattern Testability of Delay Faults.	Proceedings International Test Conference 1986, Washington, D.C., USA, September 1986 1986	(0)	1986
	Paul H. Bardell, William H. McAnney. Pseudorandom Arrays for Built-In Tests.	IEEE Trans. Computers 1986, Volume 35	(0)	1986

Your query returned 16 matches in the database.