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First name:	Grzegorz
Last name:	Mrugalski
DBLP:	97/5148
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	Janusz Rajski, Jerzy Tyszer, Grzegorz Mrugalski, Wu-Tung Cheng, Neelanjan Mukherjee, Mark Kassab. X-Press: Two-Stage X-Tolerant Compactor With Programmable Selector.	IEEE Trans. on CAD of Integrated Circuits and Systems 2008, Volume 27	(0)	2008
	Dariusz Czysz, Grzegorz Mrugalski, Janusz Rajski, Jerzy Tyszer. Low-Power Test Data Application in EDT Environment Through Decompressor Freeze.	IEEE Trans. on CAD of Integrated Circuits and Systems 2008, Volume 27	(0)	2008
	Grzegorz Mrugalski, Janusz Rajski, Dariusz Czysz, Jerzy Tyszer. New Test Data Decompressor for Low Power Applications.	Proceedings of the 44th Design Automation Conference, DAC 2007, San Diego, CA, USA, June 4-8, 2007 2007	(0)	2007
	Dariusz Czysz, Grzegorz Mrugalski, Janusz Rajski, Jerzy Tyszer. Low Power Embedded Deterministic Test.	25th IEEE VLSI Test Symposium (VTS 2007), 6-10 May 2007, Berkeley, California, USA 2007	(0)	2007
	Jerzy Tyszer, Janusz Rajski, Grzegorz Mrugalski, Nilanjan Mukherjee, Mark Kassab, Wu-Tung Cheng, Manish Sharma, Liyang Lai. X-Tolerant Compactor with On-Chip Registration and Signature-Based Diagnosis.	IEEE Design Test of Computers 2007, Volume 24	(0)	2007
	Grzegorz Mrugalski, Artur Pogiel, Janusz Rajski, Jerzy Tyszer. Fault Diagnosis With Convolutional Compactors.	IEEE Trans. on CAD of Integrated Circuits and Systems 2007, Volume 26	(0)	2007
	Grzegorz Mrugalski, Janusz Rajski, Chen Wang, Artur Pogiel, Jerzy Tyszer. Isolation of Failing Scan Cells through Convolutional Test Response Compaction.	J. Electronic Testing 2007, Volume 23	(0)	2007
	Grzegorz Mrugalski, Janusz Rajski, Jerzy Tyszer. Test response compactor with programmable selector.	Proceedings of the 43rd Design Automation Conference, DAC 2006, San Francisco, CA, USA, July 24-28, 2006 2006	(0)	2006
	Grzegorz Mrugalski, Nilanjan Mukherjee, Janusz Rajski, Jerzy Tyszer. High Performance Dense Ring Generators.	IEEE Trans. Computers 2006, Volume 55	(0)	2006
	Grzegorz Mrugalski, Chen Wang, Artur Pogiel, Jerzy Tyszer, Janusz Rajski. Fault Diagnosis in Designs with Convolutional Compactors.	Proceedings 2004 International Test Conference (ITC 2004), October 26-28, 2004, Charlotte, NC, USA 2003	(0)	2004

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