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A transient noise simulation model for the analysis of the optimal number of stages of the analog accumulator in TDI CMOS image sensors.

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    Title: A transient noise simulation model for the analysis of the optimal number of stages of the analog accumulator in TDI CMOS image sensors.
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    Date: 2016
    Publication type: Journal article
    Authors:
    No. First name Last name Show
    1. Kaiming Nie
    2. Jianxin Li
    3. Zhiyuan Gao
    4. Jiangtao Xu
    Download (by DOI): 10.1016/j.microrel.2016.01.008
    BibTeX: journals/mr/NieLGX16
    DBLP: db/journals/mr/mr60.html#NieLGX16
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    Journal
    Name: Microelectronics Reliability
    Year: 2016
    Volume: 60
    DBLP: db/journals/mr/mr60.html