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Conference
Name:	12th European Test Symposium (ETS 2007), 20 May 2007, Freiburg, Germany 2007
DBLP:	db/conf/ets/ets2007.html
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Show	Title	Venue	Rating	Date
	Conference paper Tao Xu, Krishnendu Chakrabarty. Parallel Scan-Like Testing and Fault Diagnosis Techniques for Digital Microfluidic Biochips.	12th European Test Symposium (ETS 2007), 20 May 2007, Freiburg, Germany 2007	(0)	2007
	Conference paper Alexandre Rousset, Alberto Bosio, Patrick Girard, Christian Landrault, Serge Pravossoudovitch, Arnaud Virazel. DERRIC: A Tool for Unified Logic Diagnosis.	12th European Test Symposium (ETS 2007), 20 May 2007, Freiburg, Germany 2007	(0)	2007
	Conference paper Philippe Cauvet, Serge Bernard, Michel Renovell. System-in-Package, a Combination of Challenges and Solutions.	12th European Test Symposium (ETS 2007), 20 May 2007, Freiburg, Germany 2007	(0)	2007
	Conference paper Ben Bennetts. Electronics Design-for-Test: Past, Present and Future.	12th European Test Symposium (ETS 2007), 20 May 2007, Freiburg, Germany 2007	(0)	2007
	Conference paper Paolo Bernardi, Michelangelo Grosso, Ernesto Sánchez, Matteo Sonza Reorda. On the Automatic Generation of Test Programs for Path-Delay Faults in Microprocessor Cores.	12th European Test Symposium (ETS 2007), 20 May 2007, Freiburg, Germany 2007	(0)	2007
	Conference paper Norbert Dumas, Zhou Xu, Kostas Georgopoulos, R. John T. Bunyan, Andrew Richardson. A Novel Approach for Online Sensor Testing Based on an Encoded Test Stimulus.	12th European Test Symposium (ETS 2007), 20 May 2007, Freiburg, Germany 2007	(0)	2007
	Conference paper O. Ginez, Jean Michel Daga, Patrick Girard, Christian Landrault, Serge Pravossoudovitch, Arnaud Virazel. Electrical Simulation Model of the 2T-FLOTOX Core-Cell for Defect Injection and Faulty Behavior Prediction in eFlash Memories.	12th European Test Symposium (ETS 2007), 20 May 2007, Freiburg, Germany 2007	(0)	2007
	Conference paper Sankar Gurumurthy, Ramtilak Vemu, Jacob A. Abraham, Daniel G. Saab. Automatic Generation of Instructions to Robustly Test Delay Defects in Processors.	12th European Test Symposium (ETS 2007), 20 May 2007, Freiburg, Germany 2007	(0)	2007
	Conference paper Said Hamdioui, Zaid Al-Ars, Javier Jiménez, Jose Calero. PPM Reduction on Embedded Memories in System on Chip.	12th European Test Symposium (ETS 2007), 20 May 2007, Freiburg, Germany 2007	(0)	2007
	Conference paper Stefan Holst, Hans-Joachim Wunderlich. Adaptive Debug and Diagnosis without Fault Dictionaries.	12th European Test Symposium (ETS 2007), 20 May 2007, Freiburg, Germany 2007	(0)	2007

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