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    Conference
    Name: Design, Automation and Test in Europe, DATE 2010, Dresden, Germany, March 8-12, 2010 2010
    URL: http://ieeexplore.ieee.org/xpl/mostRecentIssue.jsp?punumber=5450668
    DBLP: db/conf/date/date2010.html
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    Below you find the publications assigned to this venue.

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    Show Title Venue Rating Date
    Conference paper
    Erik Jan Marinissen.
    Testing TSV-based three-dimensional stacked ICs.
    Design, Automation and Test in Europe, DATE 2010, Dresden, Germany, March 8-12, 2010 2010 (0) 2010
    Conference paper
    Weijia Che, Amrit Panda, Karam S. Chatha.
    Compilation of stream programs for multicore processors that incorporate scratchpad memories.
    Design, Automation and Test in Europe, DATE 2010, Dresden, Germany, March 8-12, 2010 2010 (0) 2010
    Conference paper
    Massimo Cutrupi, Marco Crepaldi, Mario R. Casu, Mariagrazia Graziano.
    A flexible UWB Transmitter for breast cancer detection imaging systems.
    Design, Automation and Test in Europe, DATE 2010, Dresden, Germany, March 8-12, 2010 2010 (0) 2010
    Conference paper
    Camille Jalier, Didier Lattard, Ahmed Amine Jerraya, Gilles Sassatelli, Pascal Benoit, Lionel Torres.
    Heterogeneous vs homogeneous MPSoC approaches for a Mobile LTE modem.
    Design, Automation and Test in Europe, DATE 2010, Dresden, Germany, March 8-12, 2010 2010 (0) 2010
    Conference paper
    Sjoerd Meijer, Hristo Nikolov, Todor Stefanov.
    Throughput modeling to evaluate process merging transformations in polyhedral process networks.
    Design, Automation and Test in Europe, DATE 2010, Dresden, Germany, March 8-12, 2010 2010 (0) 2010
    Conference paper
    George Economakos, Sotirios Xydis, Ioannis Koutras, Dimitrios Soudris.
    Construction of dual mode components for reconfiguration aware high-level synthesis.
    Design, Automation and Test in Europe, DATE 2010, Dresden, Germany, March 8-12, 2010 2010 (0) 2010
    Conference paper
    Vikas Chandra, Cezary Pietrzyk, Robert C. Aitken.
    On the efficacy of write-assist techniques in low voltage nanoscale SRAMs.
    Design, Automation and Test in Europe, DATE 2010, Dresden, Germany, March 8-12, 2010 2010 (0) 2010
    Conference paper
    Melanie Elm, Hans-Joachim Wunderlich.
    BISD: Scan-based Built-In self-diagnosis.
    Design, Automation and Test in Europe, DATE 2010, Dresden, Germany, March 8-12, 2010 2010 (0) 2010
    Conference paper
    Meng Tie, Haiying Dong, Tong Wang, Xu Cheng.
    Dual-Vth leakage reduction with Fast Clock Skew Scheduling Enhancement.
    Design, Automation and Test in Europe, DATE 2010, Dresden, Germany, March 8-12, 2010 2010 (0) 2010
    Conference paper
    Matthias Müller, Axel G. Braun, Joachim Gerlach, Wolfgang Rosenstiel, Dennis Nienhüser, Johann Marius Zöllner, Oliver Bringmann.
    Design of an automotive traffic sign recognition system targeting a multi-core SoC implementation.
    Design, Automation and Test in Europe, DATE 2010, Dresden, Germany, March 8-12, 2010 2010 (0) 2010
    Show item 1 to 10 of 349  

    Your query returned 349 matches in the database.