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Name:	Proceedings IEEE International Test Conference 1991, Test: Faster, Better, Sooner, Nashville, TN, USA, October 26-30, 1991 1991
DBLP:	db/conf/itc/itc1991.html
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Show	Title	Venue	Rating	Date
	Magdy S. Abadir, Joe Newman, Desmond D'Souza, Steve Spencer. Partitioning Hierarchical Designs for Testability.	Proceedings IEEE International Test Conference 1991, Test: Faster, Better, Sooner, Nashville, TN, USA, October 26-30, 1991 1991	(0)	1991
	Miron Abramovici, James J. Kulikowski, Rabindra K. Roy. The Best Flip-Flops to Scan.	Proceedings IEEE International Test Conference 1991, Test: Faster, Better, Sooner, Nashville, TN, USA, October 26-30, 1991 1991	(0)	1991
	Kaushik De, Prithviraj Banerjee. Logic Partitioning and Resynthesis for Testability.	Proceedings IEEE International Test Conference 1991, Test: Faster, Better, Sooner, Nashville, TN, USA, October 26-30, 1991 1991	(0)	1991
	Richard Absher. Can Undergraduate Test Engineering Education Be "Faster, Better, Sooner?".	Proceedings IEEE International Test Conference 1991, Test: Faster, Better, Sooner, Nashville, TN, USA, October 26-30, 1991 1991	(0)	1991
	Robert C. Aitken. Fault Location with Current Monitoring.	Proceedings IEEE International Test Conference 1991, Test: Faster, Better, Sooner, Nashville, TN, USA, October 26-30, 1991 1991	(0)	1991
	Pranav Ashar, Srinivas Devadas, Kurt Keutzer. Gate-Delay-Fault Testability Properties of Multiplexor-Based Networks.	Proceedings IEEE International Test Conference 1991, Test: Faster, Better, Sooner, Nashville, TN, USA, October 26-30, 1991 1991	(0)	1991
	S. P. Athan, David C. Keezer, J. McKinley. High Frequency Wafer Probing and Power Supply Resonance Effects.	Proceedings IEEE International Test Conference 1991, Test: Faster, Better, Sooner, Nashville, TN, USA, October 26-30, 1991 1991	(0)	1991
	LaNae J. Avra. Allocation and Assignment in High-Level Synthesis for Self-Testable Data Paths.	Proceedings IEEE International Test Conference 1991, Test: Faster, Better, Sooner, Nashville, TN, USA, October 26-30, 1991 1991	(0)	1991
	Subir Bandyopadhyay, Bhargab B. Bhattacharya. On the Testable Design of Bilateral Bit-Level Systolic Arrays.	Proceedings IEEE International Test Conference 1991, Test: Faster, Better, Sooner, Nashville, TN, USA, October 26-30, 1991 1991	(0)	1991
	Paul H. Bardell, Michael J. Lapointe. Production Experience with Built-In Self-Test in the IBM ES/9000 System.	Proceedings IEEE International Test Conference 1991, Test: Faster, Better, Sooner, Nashville, TN, USA, October 26-30, 1991 1991	(0)	1991

Your query returned 142 matches in the database.